A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs. - Jae-Kyung Wee; Kyeong-Sik Min; Jong-Tai Park; Sang-Pil Lee; Young-Hee Kim; Tae-Heum Yang; Jong-Doo Joo; Jin-Yong Chung (IEEE J. Solid State Circuits, 2002)