At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. - Jongchul Shin; Hyunjin Kim; Sungho Kang 001 (DATE, 1999)

An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. - Hyunjin Kim; Jongchul Shin; Sungho Kang 001 (ICCD, 1999)