A 5.6MB/s 64Gb 4b/Cell NAND Flash memory in 43nm CMOS. - Cuong Trinh; Noboru Shibata; Takeshi Nakano; Mikio Ogawa; Jumpei Sato; Yoshikazu Takeyama; Katsuaki Isobe; Binh Le; Farookh Moogat; Nima Mokhlesi; Kenji Kozakai; Patrick Hong; et al. (ISSCC, 2009)

A 34 MB/s MLC Write Throughput 16 Gb NAND With All Bit Line Architecture on 56 nm Technology. - Raul Cernea; Long Pham; Farookh Moogat; Siu Lung Chan; Binh Le; Yan Li; Shouchang Tsao; Taiyuan Tseng; Khanh Nguyen; Jason Li 001; Jayson Hu; Jonghak Yuh; et al. (IEEE J. Solid State Circuits, 2009)

128Gb 3b/cell NAND flash memory in 19nm technology with 18MB/s write rate and 400Mb/s toggle mode. - Yan Li; Seungpil Lee; Ken Oowada; Hao Nguyen; Qui Nguyen; Nima Mokhlesi; Cynthia Hsu; Jason Li 001; Venky Ramachandra; Teruhiko Kamei; Masaaki Higashitani; Tuan Pham; et al. (ISSCC, 2012)

A 512Gb 3-bit/Cell 3D Flash Memory on 128-Wordline-Layer with 132MB/s Write Performance Featuring Circuit-Under-Array Technology. - Chang Hua Siau; Kwang-Ho Kim; Seungpil Lee; Katsuaki Isobe; Noboru Shibata; Kapil Verma; Takuya Ariki; Jason Li 001; Jong Yuh; Anirudh Amarnath; Qui Nguyen; Ohwon Kwon; et al. (ISSCC, 2019)

A 1-Tb 4b/Cell 4-Plane 162-Layer 3D Flash Memory With a 2.4-Gb/s I/O Speed Interface. - Jong Yuh; Jason Li 001; Heguang Li; Yoshihiro Oyama; Cynthia Hsu; Pradeep Anantula; Stanley Jeong; Anirudh Amarnath; Siddhesh Darne; Sneha Bhatia; Tianyu Tang; Aditya Arya; et al. (ISSCC, 2022)

A 1-Tb 4-b/cell 4-Plane 162-Layer 3-D Flash Memory With 2.4-Gb/s IO Interface. - Jonghak Yuh; Yen-Lung Jason Li; Heguang Li; Yoshihiro Oyama; Cynthia Hsu; Pradeep Anantula; Gwang Yeong Stanley Jeong; Anirudh Amarnath; Siddhesh Darne; Sneha Bhatia; Tianyu Tang; Aditya Arya; et al. (IEEE J. Solid State Circuits, 2023)

A 1Tb 3b/cell 3D-Flash Memory with a 29%-Improved-Energy-Efficiency Read Operation and 4.8Gb/s Power-Isolated Low-Tapped-Termination I/Os. - Kosuke Yanagidaira; Mario Sako; Yasuhiro Hirashima; Junya Matsuno; Yumi Higashi; Yutaka Shimizu; Akihiro Imamoto; Kazuaki Kawaguchi; Koji Tabata; Takeshi Nakano; Yusuke Ochi; Hiroaki Hoshino; et al. (ISSCC, 2025)