Spline regression based feature extraction for semiconductor process fault detection using support vector machine. - Jonghyuck Park; Ick-Hyun Kwon; Sung-Shick Kim; Jun-Geol Baek (Expert Syst. Appl., 2011)

Adversarial TableQA: Attention Supervision for Question Answering on Tables. - Minseok Cho; Reinald Kim Amplayo; Seung-won Hwang; Jonghyuck Park (ACML, 2018)