Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. - Woojin Jin; Yungseon Eo; William R. Eisenstadt; Jongin Shim (IEEE Trans. Very Large Scale Integr. Syst., 2001)

Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. - Seongkyun Shin; Yungseon Eo; William R. Eisenstadt; Jongin Shim (SLIP, 2002)

A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. - Yungseon Eo; Jongin Shim; William R. Eisenstadt (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. - Yungseon Eo; Seongkyun Shin; William R. Eisenstadt; Jongin Shim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. - Seongkyun Shin; Yungseon Eo; William R. Eisenstadt; Jongin Shim (ISQED, 2004)

A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. - Yungseon Eo; Seongkyun Shin; William R. Eisenstadt; Jongin Shim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. - Seongkyun Shin; Yungseon Eo; William R. Eisenstadt; Jongin Shim (IEEE Trans. Very Large Scale Integr. Syst., 2004)