MBIST Support for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Cyrille Dray; El Mehdi Boujamaa (ETS, 2020)

MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Lori Schramm; Cyrille Dray; El Mehdi Boujamaa; Khushal Gelda (ITC, 2020)

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. - Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (ETS, 2021)

MBIST-based Trim-Search Test Time Reduction for STT-MRAM. - Christopher Münch; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (VTS, 2022)

Smart Hammering: A practical method of pinhole detection in MRAM memories. - Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (DATE, 2023)

Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

MBIST-based weak bit screening method for embedded MRAM. - Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi B. Tahoori; Christopher Münch; Martin Keim (ETS, 2024)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)

MBIST-based MRAM defect screening for safety-critical applications. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (ITC, 2024)

Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (VTS, 2024)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)

MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (ETS, 2025)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)