Soft Error Issues with Scaling Technologies. - Sanghyeon Baeg; Jongsun Bae; Soonyoung Lee; Chul Seung Lim; Sang Hoon Jeon; Hyeonwoo Nam (Asian Test Symposium, 2012)

Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. - Jongsun Bae; Sanghyeon Baeg; Sungju Park (IEEE Trans. Instrum. Meas., 2012)