0.5V-VIN, 165-MA/MM2 Fully-Integrated Digital LDO Based on Event-Driven Self-Trisuerina Control. - Doyun Kim; Sung Kim; Mingoo Seok; Hyunju Ham; Jongwhan Kim (VLSI Circuits, 2018)

RUMA: On the Analysis of Defenses based on Misaligned Accesses. - DaeHee Jang; Jongwhan Kim; Minjoon Park; Yunjong Jung; Minsu Kim; Hojoon Lee 001; Brent ByungHoon Kang (CoRR, 2018)