SRAM stability design comprehending 14nm FinFET reliability. - Choelhwyi Bae; Sangwoo Pae; Cheong-sik Yu; Kangjung Kim; Yongshik Kim; Jongwoo Park 001 (IRPS, 2015)

CPI reliability and EMI benefit for MIM CAP embedded C4 package. - Hyunsuk Chun; In Hak Baick; Sangsu Ha; Eunmi Kwon; Seungbae Lee; Seil Kim; Sangwoo Pae; Jongwoo Park 001 (IRPS, 2015)

Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. - Soonyoung Lee; Ilgon Kim; Sungmock Ha; Cheong-sik Yu; Jinhyun Noh; Sangwoo Pae; Jongwoo Park 001 (IRPS, 2015)

Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. - Changze Liu; Hyun-Chul Sagong; Hyejin Kim; Seungjin Choo; Hyunwoo Lee; Yoohwan Kim; Hyunjin Kim; Bisung Jo; Minjung Jin; Jinjoo Kim; Sangsu Ha; Sangwoo Pae; et al. (IRPS, 2015)

Contact resistance of solder bump with low cost photosensitive polyimide for high performance SoC. - Jongwoo Park 001; Jungpyo Hong; Miji Lee; Dongyoon Sun; Kyung Kang; Taesung Kim; Seungwon Kim; Sujin Kwon; Changkyu Joo; Sangsu Ha; Wooyeon Kim; Jongsu Ryu; et al. (IRPS, 2015)

Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism. - Jongwoo Park 001; Miji Lee; Hanbyul Kang; Wooram Ko; Eunkyeong Choi; Junsik Im; Minwoo Lee; Dohwan Chung; Jinchul Park; Sangchul Shin; Sangwoo Pae (IRPS, 2015)

Reliability of fine pitch COF: Influence of surface morphology and CuSn intermetallic compound formation. - Jongwoo Park 001; Miji Lee; Kyunghwan Min; J.-K. Choi; Changkyu Joo; S.-C. Park; Hanbyul Kang; Sangwoo Pae (IRPS, 2015)

Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs. - Heejin Kim; Hayeon Shin; Jiyoung Park; Youngtae Choi; Jongwoo Park 001 (IRPS, 2018)

Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. - Kanghyun Choi; Jongwon Lee; Jongwoo Park 001 (IRPS, 2019)

Process Variation of Pixel Definition and Effects of Flexible OLED Luminance Degradation. - Jongwon Lee; Sangkil Kim; Yoonsuk Choi; Jongwoo Park 001 (IRPS, 2019)