Detection of Corrosion in Thick Film Resistors by X-Ray Imaging. - Jonny M. Ingman; Joni P. A. Jormanainen; Samu K. Järvinen; Natalia I. Kanko; Joonas A. R. Leppänen; Aleksi M. Vulli; Tommi J. Kärkkäinen; Juuso Rautio; Janne Jäppinen; Pertti Silventoinen (IEEE Access, 2021)

Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages. - Ivana Kovacevic-Badstuebner; Salvatore Race; Thomas Ziemann; Shweta Tiwari; Ulrike Grossner; Elena Mengotti; Enea Bianda; Joni P. A. Jormanainen (IRPS, 2022)

Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs. - Ivana Kovacevic-Badstuebner; Salvatore Race; Ulrike Grossner; Elena Mengotti; Christoph Kenel; Enea Bianda; Joni P. A. Jormanainen (IRPS, 2023)