Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. - Young Pil Kim; Beom Jun Jin; Young Wook Park; Joo Tae Moon; Sang U. Kim (Microelectron. Reliab., 2001)

Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. - Young Pil Kim; U-In Chung; Joo Tae Moon; Sang U. Kim (Microelectron. Reliab., 2003)

Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. - Jin-Wook Lee; Gyoung Ho Buh; Guk-Hyon Yon; Tai-su Park; Yu Gyun Shin; U-In Chung; Joo Tae Moon (Microelectron. Reliab., 2005)