An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. - Woosik Jeong; Joohwan Lee; Taewoo Han; Kaangchil Lee; Sungho Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. - Wooheon Kang; Hyungjun Cho; Joohwan Lee; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. - Sungyoul Seo; Yong Lee 002; Hyeonchan Lim; Joohwan Lee; Hongbom Yoo; Yojoung Kim; Sungho Kang 001 (ATS, 2015)

A scan shifting method based on clock gating of multiple groups for low power scan testing. - Sungyoul Seo; Yong Lee 002; Joohwan Lee; Sungho Kang 001 (ISQED, 2015)