Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. - Hongjoong Shin; Joonsung Park; Jacob A. Abraham (ITC, 2006)

Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. - Joonsung Park; Hongjoong Shin; Jacob A. Abraham (ISQED, 2007)

Parallel Loopback Test of Mixed-Signal Circuits. - Joonsung Park; Hongjoong Shin; Jacob A. Abraham (VTS, 2008)

LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits. - Joonsung Park; Jaeyong Chung; Jacob A. Abraham (Asian Test Symposium, 2009)

Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. - Kihyuk Han; Joonsung Park; Jae Wook Lee; Jacob A. Abraham; Eonjo Byun; Cheol-Jong Woo; Sejang Oh (ETS, 2009)

At-speed Test of High-Speed DUT Using Built-Off Test Interface. - Joonsung Park; Jae Wook Lee; Jaeyong Chung; Kihyuk Han; Jacob A. Abraham; Eonjo Byun; Cheol-Jong Woo; Sejang Oh (Asian Test Symposium, 2010)

Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. - Jaeyong Chung; Joonsung Park; Jacob A. Abraham; Eonjo Byun; Cheol-Jong Woo (VTS, 2010)

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. - Hongjoong Shin; Joonsung Park; Jacob A. Abraham (J. Electron. Test., 2010)

Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. - Kihyuk Han; Joonsung Park; Jae Wook Lee; Jaeyong Chung; Eonjo Byun; Cheol-Jong Woo; Sejang Oh; Jacob A. Abraham (J. Electron. Test., 2011)

Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. - Joonsung Park; Hongjoong Shin; Jacob A. Abraham (J. Electron. Test., 2011)

A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. - Jaeyong Chung; Joonsung Park; Jacob A. Abraham (IEEE Trans. Very Large Scale Integr. Syst., 2013)

An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4°C (3σ) From - 40°C to 130°C. - Xiao Pu 006; Mikel Ash; Krishnaswamy Nagaraj; Joonsung Park; Steve Vu; Paul Kimelman; Sean de la Haye (IEEE J. Solid State Circuits, 2015)

An oxide electrothermal filter in standard CMOS. - Lorenzo Pedala; Ugur Sonmez; Fabio Sebastiano; Kofi A. A. Makinwa; Krishnaswamy Nagaraj; Joonsung Park (IEEE SENSORS, 2016)

A 12-/14-bit, 4/2MSPS, 0.085mm2 SAR ADC in 65nm using novel residue boosting. - Joonsung Park; Krishnaswamy Nagaraj; Mikel Ash; Ajay Kumar (CICC, 2017)

High precision yet wide range on-chip oscillator with dual charge-discharge technique. - Abhijit Das; Joonsung Park (ISQED, 2017)

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ETS, 2019)

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2021)