Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. - Cora Salm; Victor M. Blanco Carballo; Joost Melai; Jurriaan Schmitz (Microelectron. Reliab., 2008)

Impact of Process Variation on MIM Capacitor Lifetime. - Joost Melai; V. Subramanian; I. Pouwel (IRPS, 2023)