Modeling, Simulation, and Testing of the Mechanical Dynamics of an RF MEMS Switch. - Jordan E. Massad; Hartono Sumali; David S. Epp; Christopher W. Dyck (ICMENS, 2005)

Characterization of the mechanical stress impact on device electrical performance in the CMOS and III-V HEMT/HBT heterogeneous integration environment. - Eric J. Wyers; T. Robert Harris; Wallace Shep Pitts; Jordan E. Massad; Paul D. Franzon (3DIC, 2015)