Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. - Erik Jan Marinissen; Bart De Wachter; Ken Smith; Jorg Kiesewetter; Mottaqiallah Taouil; Said Hamdioui (ITC, 2014)

Automated testing of bare die-to-die stacks. - Erik Jan Marinissen; Bart De Wachter; Teng Wang; Jens Fiedler; Jorg Kiesewetter; Karsten Stoll (ITC, 2015)

A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. - Erik Jan Marinissen; Ferenc Fodor; Bart De Wachter; Jorg Kiesewetter; Eric Hill; Ken Smith (ITC-Asia, 2017)