From system level to defect-oriented test: a case study. - Octávio Páscoa Dias; Jorge Semião; Marcelino B. Santos; Isabel Maria Cacho Teixeira; João Paulo Teixeira 001 (ETW, 1999)

Quality of Electronic Design: From Architectural Level to Test Coverage. - Octávio Páscoa Dias; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ISQED, 2000)

Embedded tutorial: TRP: integrating embedded test and ATE. - Yervant Zorian; Paolo Prinetto; João Paulo Teixeira 001; Isabel C. Teixeira; Carlos Eduardo Pereira; Octávio Páscoa Dias; Jorge Semião; Peter Muhmenthaler; W. Radermacher (DATE, 2001)

Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. - F. Guerreiro; Jorge Semião; A. Pierce; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2006)

Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. - Marcial Jesús Rodríguez-Irago; Juan J. Rodríguez-Andina; Fabian Vargas 001; Jorge Semião; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2006)

Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2007)

Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. - Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino Bicho Dos Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 2007)

On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2007)

Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (ISVLSI, 2007)

Robust solution for synchronous communication among multi clock domains. - Jorge Semião; João Varela; Judit Freijedo; Juan J. Rodríguez-Andina; Carlos Leong; João Paulo Teixeira 001; Isabel C. Teixeira (APCCAS, 2008)

Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. - Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DDECS, 2008)

Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2008)

Signal Integrity Enhancement in Digital Circuits. - Jorge Semião; Marcial Jesús Rodríguez-Irago; Juan J. Rodríguez-Andina; Leonardo Bisch Piccoli; Fabian Vargas 001; Marcelino Bicho Dos Santos; Isabel Maria Cacho Teixeira; João Paulo Teixeira 001 (IEEE Des. Test Comput., 2008)

Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems. - Judit Freijedo; Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2008)

Time Management for Low-Power Design of Digital Systems. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2008)

Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. - Jorge Semião; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2009)

Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment. - Jorge Semião; Judit Freijedo; Marlon Moraes; M. Mallmann; Carlos Lemos Antunes; Juliano Benfica; Fabian Vargas 001; Marcelino B. Santos; Isabel C. Teixeira; Juan J. Rodríguez-Andina; João Paulo Teixeira 001; Daniel Lupi; et al. (LATW, 2009)

Investigating the Use of BICS to detect resistive-open defects in SRAMs. - Raul Chipana; Letícia Maria Veiras Bolzani; Fabian Vargas 001; Jorge Semião; Juan J. Rodríguez-Andina; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2010)

Predictive error detection by on-line aging monitoring. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2010)

Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. - Judit Freijedo; Lucía Costas; Jorge Semião; Juan J. Rodríguez-Andina; María José Moure; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2010)

Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. - Vasco Bexiga; Carlos Leong; Jorge Semião; Isabel C. Teixeira; João Paulo Teixeira 001; María Dolores Valdés; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001 (FPL, 2011)

Modeling the effect of process variations on the timing response of nanometer digital circuits. - Judit Freijedo; Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (LATW, 2011)

On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. - R. S. Oliveira; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (LATW, 2011)

Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects. - María Dolores Valdés; Judit Freijedo; María José Moure; Juan J. Rodríguez-Andina; Jorge Semião; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (LATW, 2011)

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. - Celestino V. Martins; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (VTS, 2011)

Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. - Judit Freijedo; María Dolores Valdés; Lucía Costas; María José Moure; Juan J. Rodríguez-Andina; Jorge Semião; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2011)

On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. - R. S. Oliveira; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (J. Low Power Electron., 2011)

The influence of clock-gating on NBTI-induced delay degradation. - Jackson Pachito; Celestino V. Martins; Jorge Semião; Marcelino Bicho Dos Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IOLTS, 2012)

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. - Jackson Pachito; Celestino V. Martins; Bruno Jacinto; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IEEE Des. Test Comput., 2012)

Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. - Judit Freijedo; Jorge Semião; Juan J. Rodríguez-Andina; Fabian Vargas 001; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Electron. Test., 2012)

Aging monitoring with local sensors in FPGA-based designs. - Carlos Leong; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001; María Dolores Valdés; Judit Freijedo; Juan J. Rodríguez-Andina; Fabian Vargas 001 (FPL, 2013)

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. - Julio César Vázquez; Víctor H. Champac; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (J. Electron. Test., 2013)

Performance sensor for tolerance and predictive detection of delay-faults. - Jorge Semião; David Saraiva; Carlos Leong; André Romão; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (DFT, 2014)

A distributed load scheduling mechanism for micro grids. - Jânio M. Monteiro; Jorge Eduardo; Pedro J. S. Cardoso; Jorge Semião (SmartGridComm, 2014)

Integration of a Real-Time Stochastic Routing Optimization Software with an Enterprise Resource Planner. - Pedro J. S. Cardoso; Gabriela Schütz; Jorge Semião; Jânio M. Monteiro; João M. F. Rodrigues; Andriy Mazayev; Emanuel Ey; Micael Viegas (GISTAM (Selected Papers), 2015)

Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner. - Pedro J. S. Cardoso; Gabriela Schütz; Jorge Semião; Jânio M. Monteiro; João M. F. Rodrigues; Andriy Mazayev; Emanuel Ey Vieira; Micael Viegas; Carlos Neves 003; Sérgio Anastácio (GISTAM, 2015)

Fault-tolerance in FPGA focusing power reduction or performance enhancement. - Carlos Leong; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (LATS, 2015)

Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling. - Carlos Leong; Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (J. Low Power Electron., 2015)

Development of an Energy Management System for the Charge Scheduling of Plug-in Electric Vehicles. - Dario Cruz; Nelson Pinto; Jânio M. Monteiro; Pedro J. S. Cardoso; Cristiano Cabrita; Jorge Semião; Luís M. R. Oliveira; João M. F. Rodrigues (HCI (8), 2018)

Performance Sensor for Reliable Operation. - Jorge Semião; Ruben Cabral; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (HCI (8), 2018)

A Zeta-CSC Converter Combination for Single-Input and Bipolar Output. - Salvador P. Litran; Eladio Durán; María Bella Ferrera; Jorge Semião; Rafael S. Barroso (IECON, 2019)

Internet of Things and Artificial Intelligence - A Wining Partnership? - Jorge Semião; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (Convergence of Artificial Intelligence and the Internet of Things, 2020)

SRAM Performance Sensor. - Jorge Semião; Luís Santos; Marcelino B. Santos (DCIS, 2021)

DRAM Performance Sensor. - Jorge Semião; Luís Santos; Marcelino B. Santos (HCI (7), 2022)

Quasi-Resonant DC-DC Converter Single-Switch for Single-Input Bipolar-Output Applications. - Cristian Díaz Martín; Eladio Durán Aranda; Salvador Pérez Litrán; Jorge Semião (IECON, 2022)

A Laboratory Fault-Injection Automation System for Industrial Pumping Predictive Maintenance. - Gonçalo Azinheira; Sérgio Brito; Jorge Semião; Nelson Sousa (ICPS, 2025)