Passive Intermodulation (PIM) Test and Measurement. - Stephen Moss; Elanchezhian Veeramani; Joris Angelo Sundaram Jerome (NATW, 2020)

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. - P. Srinivasan 002; Fernando Guarin; Shafi Syed; Joris Angelo Sundaram Jerome; Wen Liu; Sameer H. Jain; Dimitri Lederer; Stephen Moss; Paul Colestock; Anirban Bandyopadhyay; Ned Cahoon; Byoung Min; et al. (IRPS, 2021)

22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability. - Germain Bossu; Shafi Syed; S. Evseev; Joris Angelo Sundaram Jerome; Wafa Arfaoui; D. Lipp; Mahesh Siddabathula (IRPS, 2022)