Noise Analysis and Removal in 3D Electron Microscopy. - Joris Roels; Jan Aelterman; Jonas De Vylder; Hiêp Quang Luong; Yvan Saeys; Saskia Lippens; Wilfried Philips (ISVC (1), 2014)

Decreasing Time Consumption of Microscopy Image Segmentation Through Parallel Processing on the GPU. - Joris Roels; Jonas De Vylder; Yvan Saeys; Bart Goossens; Wilfried Philips (ACIVS, 2016)

Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization. - Joris Roels; Jan Aelterman; Jonas De Vylder; Hiêp Quang Luong; Yvan Saeys; Wilfried Philips (EMBC, 2016)

Convolutional neural network pruning to accelerate membrane segmentation in electron microscopy. - Joris Roels; Jonas De Vylder; Jan Aelterman; Yvan Saeys; Wilfried Philips (ISBI, 2017)

Lower bounds on the robustness to adversarial perturbations. - Jonathan Peck; Joris Roels; Bart Goossens; Yvan Saeys (NIPS, 2017)

Cost-Efficient Segmentation of Electron Microscopy Images Using Active Learning. - Joris Roels; Yvan Saeys (BNAIC/BENELEARN, 2019)

Domain Adaptive Segmentation In Volume Electron Microscopy Imaging. - Joris Roels; Julian Hennies; Yvan Saeys; Wilfried Philips; Anna Kreshuk (ISBI, 2019)

On-Chip Non-Dispersive Infrared CO2 Sensor Based On an Integrating Cylinder. - Xiaoning Jia; Joris Roels; Roel Baets; Gunther Roelkens (Sensors, 2019)

A Miniaturised, Fully Integrated NDIR CO2 Sensor On-Chip. - Xiaoning Jia; Joris Roels; Roel Baets; Gunther Roelkens (Sensors, 2021)

BioSegment: Active Learning segmentation for 3D electron microscopy imaging. - Benjamin Rombaut 001; Joris Roels; Yvan Saeys (IAL@PKDD/ECML, 2022)