Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. - Hamidreza Hashempour; Jos Dohmen; Bratislav Tasic; Bram Kruseman; Camelia Hora; Maikel van Beurden; Yizi Xing (DATE, 2011)

Defect Oriented Testing for analog/mixed-signal devices. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (ITC, 2011)

Defect Oriented Testing for Analog/Mixed-Signal Designs. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (IEEE Des. Test Comput., 2012)

Fast time-domain simulation for reliable fault detection. - Bratislav Tasic; Jos J. Dohmen; Rick Janssen; E. Jan W. ter Maten; Theo G. J. Beelen; Roland Pulch (DATE, 2016)