Physical degradation of GaN HEMT devices under high drain bias reliability testing. - S. Y. Park; Carlo Floresca; Uttiya Chowdhury; Jose L. Jimenez; Cathy Lee; Edward Beam; Paul Saunier; Tony Balistreri; Moon J. Kim (Microelectron. Reliab., 2009)

The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability. - Milan Tapajna; Nicole Killat; Uttiya Chowdhury; Jose L. Jimenez; Martin Kuball (Microelectron. Reliab., 2012)

A GPU-accelerated computational fluid dynamics solver for assessing shear-driven indoor airflow and virus transmission by scale-resolved simulations. - Marko Korhonen; Alpo Laitinen; Gizem Ersavas Isitman; Jose L. Jimenez; Ville Vuorinen (J. Comput. Sci., 2024)