A BIST and Boundary-Scan Economics Framework. - José M. Miranda (IEEE Des. Test Comput., 1997)

Test Reuse at System Level. - José M. Miranda; Scott Davidson 001; Peter Dziel; Saman Adham; Steve Millman (VTS, 1998)

Embedded Boundary Scan. - Bradford G. Van Treuren; José M. Miranda (IEEE Des. Test Comput., 2003)

JTAG-based vector and chain management for system test. - Bradford G. Van Treuren; Bryan E. Peterson; José M. Miranda (ITC, 2005)