Defect Detection from Multi-frequency Limited Data via Topological Sensitivity. - José Félix Funes; José Manuel Perales; María-Luisa Rapún; José M. Vega (J. Math. Imaging Vis., 2016)

Variable Thickness in Plates - A Solution for SHM Based on the Topological Derivative. - Anxo Martínez; Alfredo Güemes; José Manuel Perales; José M. Vega (Sensors, 2020)