Fault-tolerance: new trends for digital circuits. - Jose Miguel Vieira dos Santos; José Manuel Martins Ferreira (ICECS, 1998)

Concurrent Scan Monitoring and Multi-Pattern Search. - Jose Miguel Vieira dos Santos (IOLTW, 2000)

TRACS-TRansient Activity Checking with Scan Cells. - Jose Miguel Vieira dos Santos (IOLTW, 2001)

Recovering Sequential Circuits from Temporary Faults: The Survival Capability of Scan-Cells. - Jose Miguel Vieira dos Santos (IOLTW, 2002)

On the Design of Long-Life Reliable Systems for Ground-Based Applications. - Jose Miguel Vieira dos Santos (IOLTS, 2004)