Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. - Johannes Hoffmann; Sophie De Préville; Bruno Eckmann; Hung-Ju Lin; Benedikt Herzog; Kamel Haddadi; Didier Théron; Georg Gramse; Damien Richert; José Morán-Meza; François Piquemal (IEEE Trans. Instrum. Meas., 2024)