Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (Asian Test Symposium, 2000)

Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Soares Lubaszewski (LATW, 2000)

The Use of Macromodels on Op-Amp Circuits Fault Modeling. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (LATW, 2000)

Fault Models and Compact Test Vectors for MOS OpAmp circuits. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Soares Lubaszewski; Antonio Carneiro de Mesquita Filho (SBCCI, 2000)

Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski (VTS, 2000)

Designing Testable Networks for Transfer Function Realization. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski; Antonio Carneiro de Mesquita Filho (LATW, 2001)

Filter Sensitivity Analysis Using the TRAM. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Vladimir Castro Alves; Marcelo Lubaszewski (LATW, 2001)

Fault Models and Test Generation for OpAmp Circuits - The FFM. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Vladimir Castro Alves; Marcelo Lubaszewski (J. Electron. Test., 2001)

Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. - José Vicente Calvano; Vladimir Castro Alves; Marcelo Lubaszewski; Antonio Carneiro de Mesquita Filho (LATW, 2002)

State Model Approach for Analog Fault Modeling. - José Vicente Calvano; Antonio Carneiro de Mesquita Filho; Marcelo Lubaszewski; Vladimir Castro Alves (LATW, 2002)

Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. - José Vicente Calvano; Vladimir Castro Alves; Antonio Carneiro de Mesquita Filho; Marcelo Lubaszewski (VTS, 2002)

Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. - José Vicente Calvano; Marcelo Lubaszewski (IWSOC, 2003)

ATPG for fault diagnosis on analog electrical networks using evolutionary techniques. - Carlos Eduardo Savioli; Claudio C. Czendrodi; José Vicente Calvano; Antonio Carneiro de Mesquita Filho (SBCCI, 2004)

Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. - Carlos Eduardo Savioli; Claudio C. Czendrodi; José Vicente Calvano; Antonio Carneiro de Mesquita Filho (DATE, 2005)

Using Swarm Intelligence to Solve Some Analog Test Issues. - Carlos E. F. Savioli; Claudio E. C. Szendrodi; José Vicente Calvano; Antonio Carneiro de Mesquita Filho (LATW, 2006)

Functional Test of Field Programmable Analog Arrays. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (VTS, 2006)

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (J. Electron. Test., 2007)