Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability. - Alexander Hirler; Josef Biba; Adnan Alsioufy; T. Lehndorff; Torsten Sulima; H. Lochner; U. Abelein; Walter Hansch (Microelectron. Reliab., 2017)

Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. - Alexander Hirler; Adnan Alsioufy; Josef Biba; T. Lehndorff; D. Lipp; Helmut Lochner; Mahesh Siddabathula; S. Simon; Torsten Sulima; Maciej Wiatr; Walter Hansch (IRPS, 2019)