Approximate simulation of circuits with probabilistic behavior. - Alexandru Paler; Josef Kinseher; Ilia Polian; John P. Hayes (DFTS, 2013)

On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. - Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian (ATS, 2015)

Improving SRAM test quality by leveraging self-timed circuits. - Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian; Andreas Leininger (DATE, 2016)

Failure mechanisms and test methods for the SRAM TVC write-assist technique. - Josef Kinseher; Moritz Völker; Leonardo Bonet Zordan; Ilia Polian (ETS, 2016)

Analyzing the effects of peripheral circuit aging of embedded SRAM architectures. - Josef Kinseher; Leonhard Heis; Ilia Polian (DATE, 2017)

Improving Testability and Reliability of Advanced SRAM Architectures. - Josef Kinseher; Moritz Völker; Ilia Polian (IEEE Trans. Emerg. Top. Comput., 2019)

New Methods for Improving Embedded Memory Manufacturing Tests - Josef Kinseher (2019)