Low-frequency noise of thick-film resistors as quality and reliability indicator. - Dubravka Rocak; Darko Belavic; Marko Hrovat; Josef Sikula; Pavel Koktavy; Jan Pavelka; Vlasta Sedlakova (Microelectron. Reliab., 2001)

Transport and noise properties of CdTe(Cl) crystals. - P. Schauer; Josef Sikula; Pavel Moravec 003 (Microelectron. Reliab., 2001)

Noise and transport characterisation of tantalum capacitors. - Jan Pavelka; Josef Sikula; Petr Vasina; Vlasta Sedlakova; Munecazu Tacano; Sumihisa Hashiguchi (Microelectron. Reliab., 2002)

Failure modes of tantalum capacitors made by different technologies. - Petr Vasina; T. Zednicek; Josef Sikula; Jan Pavelka (Microelectron. Reliab., 2002)

Electro-ultrasonic spectroscopy of polymer-based thick film layers. - Vlasta Sedlakova; Josef Sikula; Pavel Tofel; Jiri Majzner (Microelectron. Reliab., 2008)