Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits. - Josep Altet; Antonio Rubio 001; Hideo Tamamoto (Asian Test Symposium, 1997)

Differential Sensing Strategy for Dynamic Thermal Testing of ICs. - Josep Altet; Antonio Rubio 001 (VTS, 1997)

Differential Thermal Testing: An Approach to its Feasibility. - Josep Altet; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire; Emmanuel Schaub; Hideo Tamamoto (J. Electron. Test., 1999)

Thermal Testing: Fault Location Strategies. - Josep Altet; Antonio Rubio 001; Emmanuel Schaub; Stefan Dilhaire; Wilfrid Claeys (VTS, 2000)

Thermal coupling in integrated circuits: application to thermal testing. - Josep Altet; Antonio Rubio 001; Emmanuel Schaub; Stefan Dilhaire; Wilfrid Claeys (IEEE J. Solid State Circuits, 2001)

CMOS Differential and Absolute Thermal Sensors. - Ashish Syal; Victor Lee; André Ivanov; Josep Altet (J. Electron. Test., 2002)

Structural RFIC device testing through built-in thermal monitoring. - Josep Altet; Antonio J. Rubio; José Luis Rosselló; Jaume Segura 001 (IEEE Commun. Mag., 2003)

Thermal Testing of Analogue Integrated Circuits: A Case Study. - Josep Altet; André Ivanov; A. Wong (J. Electron. Test., 2003)

Sensing temperature in CMOS circuits for Thermal Testing. - Josep Altet; Antonio Rubio 001; M. Amine Salhi; Jose Luis Gálvez; Stefan Dilhaire; Ashish Syal; André Ivanov (VTS, 2004)

Applications of temperature phase measurements to IC testing. - Josep Altet; Jean-Michel Rampnoux; Jean-Christophe Batsale; Stefan Dilhaire; Antonio Rubio 001; Wilfrid Claeys; Stéphane Grauby (Microelectron. Reliab., 2004)

Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. - Josep Altet; Diego Mateo; José Luis González 001; Eduardo Aldrete-Vidrio (ISCAS, 2006)

Dynamic Surface Temperature Measurements in ICs. - Josep Altet; Wilfrid Claeys; Stefan Dilhaire; Antonio Rubio 001 (Proc. IEEE, 2006)

Electrical characterization of analogue and RF integrated circuits by thermal measurements. - Diego Mateo; Josep Altet; Eduardo Aldrete-Vidrio (Microelectron. J., 2007)

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. - Eduardo Aldrete-Vidrio; M. Amine Salhi; Josep Altet; Stéphane Grauby; Diego Mateo; H. Michel; L. Clerjaud; Jean-Michel Rampnoux; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire (ETS, 2008)

Non-invasive RF built-in testing using on-chip temperature sensors. - Eduardo Aldrete-Vidrio; Marvin Onabajo; Josep Altet; Diego Mateo; José Silva-Martínez (ITC, 2009)

Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. - Josep Altet; Diego Mateo; Eduardo Aldrete-Vidrio (IOLTS, 2010)

Monitor strategies for variability reduction considering correlation between power and timing variability. - Joan Mauricio; Francesc Moll; Josep Altet (SoCC, 2011)

Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. - Marvin Onabajo; Didac Gómez; Eduardo Aldrete-Vidrio; Josep Altet; Diego Mateo; José Silva-Martínez (J. Electron. Test., 2011)

Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. - Marvin Onabajo; Josep Altet; Eduardo Aldrete-Vidrio; Diego Mateo; José Silva-Martínez (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

Testing RF circuits with true non-intrusive built-in sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Josep Altet (DATE, 2012)

Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor. - Nathalie Deltimple; José Luis González 001; Josep Altet; Yohann Luque; Eric Kerherve (ESSCIRC, 2012)

On line monitoring of RF power amplifiers with embedded temperature sensors. - Josep Altet; Diego Mateo; Didac Gómez (IOLTS, 2012)

DC temperature measurements for power gain monitoring in RF power amplifiers. - Josep Altet; Diego Mateo; Didac Gómez; Xavier Perpiñà; Miquel Vellvehí; Xavier Jordà (ITC, 2012)

On the Use of Static Temperature Measurements as Process Variation Observable. - Didac Gómez; Josep Altet; Diego Mateo (J. Electron. Test., 2012)

Electro-thermal coupling analysis methodology for RF circuits. - Didac Gómez; Cédric Dufis; Josep Altet; Diego Mateo; José Luis González 001 (Microelectron. J., 2012)

Defect-oriented non-intrusive RF test using on-chip temperature sensors. - Louay Abdallah; Haralampos-G. D. Stratigopoulos; Salvador Mir; Josep Altet (VTS, 2013)

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. - Josep Altet; Eduardo Aldrete-Vidrio; Ferran Reverter; Didac Gómez; José Luis González 001; Marvin Onabajo; José Silva-Martínez; B. Martineau; X. Perpiñà; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Xavier Aragonès; et al. (MWSCAS, 2014)

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. - Josep Altet; José Luis González 001; Didac Gómez; Xavier Perpiñà; Wilfrid Claeys; Stéphane Grauby; Cédric Dufis; Miquel Vellvehí; Diego Mateo; Ferran Reverter; Stefan Dilhaire; Xavier Jordà (Microelectron. J., 2014)

On-Chip Thermal Testing Using MOSFETs in Weak Inversion. - Ferran Reverter; Josep Altet (IEEE Trans. Instrum. Meas., 2015)

Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology. - Xavier Aragonès; Alex Alvarez; Juan Pablo Rovayo; Josep Altet; Diego Mateo (DCIS, 2019)

On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. - Anant Rungta; Josep Altet; Enrique Barajas; Antonio Rubio 001; Xavier Aragonès; Diego Mateo (DCIS, 2019)

Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. - Enrique Barajas; Xavier Aragonès; Diego Mateo; Josep Altet (Sensors, 2019)

Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. - Xavier Perpiñà; Ferran Reverter; Javier Leon; Enrique Barajas; Miquel Vellvehí; Xavier Jordà; Josep Altet (IEEE Trans. Instrum. Meas., 2019)

BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. - Josep Altet; Enrique Barajas; Diego Mateo; Alexandre Billong; Xavier Aragonès; Xavier Perpiñà; Ferran Reverter (Sensors, 2021)

Two examples of approximate arithmetic to reduce hardware complexity and power consumption. - Jordi Fornt; Leixin Jin; Imanol Etxezarreta; Pau Fontova; Josep Altet; Antonio Calomarde; Enric Morancho; Francesc Moll; Antonio Rubio 001 (DCIS, 2022)

An automotive case study on the limits of approximation for object detection. - Martí Caro; Hamid Tabani; Jaume Abella 001; Francesc Moll; Enric Morancho; Ramon Canal; Josep Altet; Antonio Calomarde; Francisco J. Cazorla; Antonio Rubio 001; Pau Fontova; Jordi Fornt (J. Syst. Archit., 2023)

Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. - Josep Altet; Xavier Aragonès; Enrique Barajas; Xavier Gisbert; Sergio Martínez; Diego Mateo (Sensors, 2023)

An Energy-Efficient GeMM-Based Convolution Accelerator With On-the-Fly im2col. - Jordi Fornt; Pau Fontova-Musté; Martí Caro; Jaume Abella 001; Francesc Moll; Josep Altet; Christoph Studer (IEEE Trans. Very Large Scale Integr. Syst., 2023)

Mix-GEMM: Extending RISC-V CPUs for Energy-Efficient Mixed-Precision DNN Inference Using Binary Segmentation. - Jordi Fornt; Enrico Reggiani; Pau Fontova-Musté; Narcís Rodas; Alessandro Pappalardo; Osman Sabri Unsal; Adrián Cristal Kestelman; Josep Altet; Francesc Moll; Jaume Abella 001 (IEEE Trans. Computers, 2025)