Généralisation des méthodes de scan pour le test des circuits intégrés complexes et application à des circuits critiques en vitesse. (Generalization of the scan methods for the test of complex integrated circuits and application to high speed circuits). - Joseph Bulone (1994)

A 622/155 mbps ATM line terminator mono-chip. - Mario Diaz-Nava; Didier Belot; P. Delerue; Joseph Bulone (ED&TC, 1995)

A single-chip CIF 30-Hz, H261, H263, and H263+ video encoder/decoder with embedded display controller. - Michel Harrand; Jose Sanches; Alain Bellon; Joseph Bulone; Alain Tournier; Olivier Deygas; Jean-Claude Herluison; David Doise; Elisabeth Berrebi (IEEE J. Solid State Circuits, 1999)