Analysis of Gate Array Failures Using Functional ATE. - G. F. Meravi; J. J. Bell; Joseph C. Bernier (ITC, 1983)

A process independent ESD design methodology. - Joseph C. Bernier; Gregg D. Croft; W. R. Young (ISCAS (1), 1999)

An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique. - Jui-Chu Lee; R. Young; Juin J. Liou; Gregg D. Croft; Joseph C. Bernier (IEEE Trans. Instrum. Meas., 2001)