Utilizing Timed Petri Nets to Guide Data-Driven Fault Diagnosis of PLC-Timed Event Systems. - Joseph Cohen; Baoyang Jiang; Jun Ni 002 (SCIS/ISIS, 2020)

A Deep Fuzzy Semi-supervised Approach to Clustering and Fault Diagnosis of Partially Labeled Semiconductor Manufacturing Data. - Joseph Cohen; Jun Ni 002 (NAFIPS, 2021)

Fault Prognosis of Turbofan Engines: Eventual Failure Prediction and Remaining Useful Life Estimation. - Joseph Cohen; Xun Huan; Jun Ni 002 (CoRR, 2023)

Stochastic Deep Koopman Model for Quality Propagation Analysis in Multistage Manufacturing Systems. - Zhiyi Chen; Harshal Maske; Huanyi Shui; Devesh Upadhyay; Michael Hopka; Joseph Cohen; Xingjian Lai; Xun Huan; Jun Ni 002 (CoRR, 2023)

An Interdisciplinary Outlook on Large Language Models for Scientific Research. - James Boyko; Joseph Cohen; Nathan Fox; Maria Han Veiga; Jennifer I-Hsiu Li; Jing Liu; Bernardo Modenesi; Andreas H. Rauch; Kenneth N. Reid; Soumi Tribedi; Anastasia Visheratina; Xin Xie (CoRR, 2023)

Shapley-based explainable AI for clustering applications in fault diagnosis and prognosis. - Joseph Cohen; Xun Huan; Jun Ni 002 (J. Intell. Manuf., 2024)