Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. - J. Yang; Joseph J. Kopanski; Adam Postula; Marek E. Bialkowski (Microelectron. Reliab., 2005)

Deterministic Tagging Technology for Device Authentication. - Jungjoon Ahn; Jihong Kim 001; Joseph J. Kopanski; Yaw S. Obeng (ICICDT, 2021)