Field testing for cosmic ray soft errors in semiconductor memories. - Timothy J. O'Gorman; Joseph M. Ross; Allen H. Taber; James F. Ziegler; Hans P. Muhlfeld; Charles J. Montrose; Huntington W. Curtis; James L. Walsh (IBM J. Res. Dev., 1996)

IBM experiments in soft fails in computer electronics (1978-1994). - James F. Ziegler; Huntington W. Curtis; Hans P. Muhlfeld; Charles J. Montrose; B. Chin; Michael Nicewicz; C. A. Russell; Wen Y. Wang; Leo B. Freeman; P. Hosier; L. E. LaFave; James L. Walsh; et al. (IBM J. Res. Dev., 1996)

Accelerated testing for cosmic soft-error rate. - James F. Ziegler; Hans P. Muhlfeld; Charles J. Montrose; Huntington W. Curtis; Timothy J. O'Gorman; Joseph M. Ross (IBM J. Res. Dev., 1996)

A 390-mm2, 16-bank, 1-Gb DDR SDRAM with hybrid bitline architecture. - Toshiaki Kirihata; Gerhard Mueller; Brian Ji; Gerd Frankowsky; Joseph M. Ross; Hartmud Terletzki; Dmitry G. Netis; Oliver Weinfurtner; David R. Hanson; Gabriel Daniel; Louis Lu-Chen Hsu; Daniel W. Storaska; et al. (IEEE J. Solid State Circuits, 1999)