Testing Delay Faults in Embedded CAMs. - Xiaogang Du; Sudhakar M. Reddy; Joseph Rayhawk; Wu-Tung Cheng (Asian Test Symposium, 2003)

BIST for Deep Submicron ASIC Memories with High Performance Application. - Theo J. Powell; Wu-Tung Cheng; Joseph Rayhawk; Omer Samman; Paul Policke; Sherry Lai (ITC, 2003)

At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. - Xiaogang Du; Sudhakar M. Reddy; Wu-Tung Cheng; Joseph Rayhawk; Nilanjan Mukherjee 001 (VLSI Design, 2004)

Memory BIST Using ESP. - Xiaogang Du; Sudhakar M. Reddy; Don E. Ross; Wu-Tung Cheng; Joseph Rayhawk (VTS, 2004)

Chasing subtle embedded RAM defects for nanometer technologies. - Theo J. Powell; Amrendra Kumar; Joseph Rayhawk; Nilanjan Mukherjee 001 (ITC, 2005)