A 16 kb 1T1C FeRAM test chip using current-based reference scheme. - Joseph Wai Kit Siu; Yadollah Eslami; Ali Sheikholeslami; P. Glenn Gulak; Toru Endo; Shoichiro Kawashima (CICC, 2002)

A current-based reference-generation scheme for 1T-1C ferroelectric random-access memories. - Joseph Wai Kit Siu; Yadollah Eslami; Ali Sheikholeslami; P. Glenn Gulak; Toru Endo; Shoichiro Kawashima (IEEE J. Solid State Circuits, 2003)