Sequential Adaptive Detection for In-Situ Transmission Electron Microscopy (TEM). - Yang Cao 013; Shixiang Zhu; Yao Xie 002; Jordan Key; Josh Kacher; Raymond R. Unocic; Christopher M. Rouleau (ICASSP, 2018)

Harvesting data revolution for transmission electron microscopy (TEM) using signal processing. - Shixiang Zhu; Sven P. Voigt; Henry Shaowu Yuchi; Jordan Key; Yao Xie 002; Josh Kacher; Surya R. Kalidindi (CoRR, 2021)

Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling. - Gihun Choe; Prasanna Venkatesan Ravindran; Anni Lu; Jae Hur; Maximilian Lederer; André Reck; Sarah Lombardo; Nashrah Afroze; Josh Kacher; Asif Islam Khan; Shimeng Yu (VLSI Technology and Circuits, 2022)

In Situ Transmission Electron Microscopy: Signal processing challenges and examples. - Josh Kacher; Yao Xie 002; Sven P. Voigt; Shixiang Zhu; Henry Shaowu Yuchi; Jordan Key; Surya R. Kalidindi (IEEE Signal Process. Mag., 2022)