Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface. - Markus P. K. Turunen; Pekka Marjamäki; Matti Paajanen; Jouko Lahtinen; Jorma K. Kivilahti (Microelectron. Reliab., 2004)

Mimicking Neurotransmitter Release and Long-Term Plasticity by Oxygen Vacancy Migration in a Tunnel Junction Memristor. - Hongwei Tan; Sayani Majumdar; Qihang Qin; Jouko Lahtinen; Sebastiaan van Dijken (Adv. Intell. Syst., 2019)