Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern. - Jounghun Park; Gilsang Yoon; Donghyun Go; Jungsik Kim; Jeong-Soo Lee (IEEE Access, 2021)

Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory. - Gilsang Yoon; Donghyun Go; Jounghun Park; Donghwi Kim; Jungsik Kim; Jeong-Soo Lee (IEEE Access, 2022)

Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory. - Jounghun Park; Gilsang Yoon; Donghyun Go; Donghwi Kim; Ukju An; Jongwoo Kim; Jungsik Kim; Jeong-Soo Lee (IRPS, 2023)