Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System. - Joy Y. Liao; G. L. Woods; X. Chen; Howard L. Marks (Microelectron. Reliab., 2005)

OBIRCH analysis of electrically stressed advanced graphic ICs. - Joy Y. Liao; Howard L. Marks; F. Beaudoin (Microelectron. Reliab., 2007)

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. - Joy Y. Liao; Tung Ton; Nathan Slattengren; Steven Kasapi; William K. Lo; Howard L. Marks; Yin S. Ng; Ted R. Lundquist (Microelectron. Reliab., 2009)

Scan chain failure analysis using laser voltage imaging. - Joy Y. Liao; Steven Kasapi; Bruce Cory; Howard L. Marks; Yin S. Ng (Microelectron. Reliab., 2010)

Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits. - Somayyeh Rahimi; Christian Schmidt 026; Joy Y. Liao; Howard Lee Marks; Kyung Mo Shin (IRPS, 2020)

Recent Developments in EOTPR Towards a Fully Automated Tool for High Volume Failure Analysis. - Tom White; Jesse Alton; Brett Gibson; Martin Igarashi; Joy Y. Liao; Timothy Pham; Howard L. Marks (IRPS, 2025)