Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. - Joycelyn Hai; Florian Cacho; A. Divay; Estelle Lauga-Larroze; Jean-Daniel Arnould; Jeremie Forest; Vincent Knopik; Xavier Garros (IRPS, 2022)

Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. - Tidjani Garba-Seybou; Xavier Federspiel; Frederic Monsieur; Mathieu Sicre; Florian Cacho; Joycelyn Hai; Alain Bravaix (IRPS, 2023)

Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. - Joycelyn Hai; Florian Cacho; X. Federspiel; Tidjani Garba-Seybou; A. Divay; Estelle Lauga-Larroze; Jean-Daniel Arnould (IRPS, 2023)

Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS. - Florian Cacho; P. Cathelin; Joycelyn Hai; S. Bouvot; Jean-Francois Jozef Nowakowski; M. Martinez; R. Debroucke; S. Jean; R. Paulin; J. Antonijevic; X. Federspiel; Nicolas Planes; et al. (IRPS, 2024)

A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles. - A. Divay; Cédric Dehos; Ismael Charlet; Fred Gaillard; B. Duriez; Xavier Garros; J. Antonijevic; Joycelyn Hai; Nathalie Revil; Jeremie Forest; Vincent Knopik; Florian Cacho; et al. (IRPS, 2024)