Similarity matching of wafer bin maps for manufacturing intelligence to empower Industry 3.5 for semiconductor manufacturing. - Chia-Yu Hsu; Wei-Ju Chen; Ju-Chien Chien (Comput. Ind. Eng., 2020)

Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification. - Chia-Yu Hsu; Ju-Chien Chien (J. Intell. Manuf., 2022)