Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria. - Francisco J. García-Sánchez; Adelmo Ortiz-Conde; Juan Muci (Microelectron. Reliab., 2006)

Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juan Muci; Denise C. Lugo Muñoz; Álvaro D. Latorre Rey; Ching-Sung Ho; Juin J. Liou (Microelectron. Reliab., 2009)

An explicit multi-exponential model for semiconductor junctions with series and shunt resistances. - Denise C. Lugo Muñoz; Juan Muci; Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Michelly de Souza; Marcelo Antonio Pavanello (Microelectron. Reliab., 2011)

Revisiting MOSFET threshold voltage extraction methods. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juan Muci; Alberto Terán Barrios; Juin J. Liou; Ching-Sung Ho (Microelectron. Reliab., 2013)

A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. - Francisco J. García-Sánchez; Adelmo Ortiz-Conde; Juan Muci; Andrea Sucre-González; Juin J. Liou (Microelectron. Reliab., 2015)