In-situ analysis of nitrogen stress in field-grown wheat: Raman spectroscopy as a non-destructive and rapid method. - Zhen Gao; Daming Dong; Guiyan Yang; Xuelin Wen; Juekun Bai; Fengjing Cao; Chunjiang Zhao 001; Xiande Zhao (Comput. Electron. Agric., 2025)