Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. - Younggeun Ji; Jeonghoon Kim; Jungin Kim; Miji Lee; Jaeheon Noh; Taeyoung Jeong; Juhyeon Shin; Junho Kim; Young Heo; Ung Cho; Hyun-Chul Sagong; Junekyun Park; et al. (IRPS, 2018)

Entropy is not Enough for Test-Time Adaptation: From the Perspective of Disentangled Factors. - Jonghyun Lee 004; Dahuin Jung; Saehyung Lee; Junsung Park; Juhyeon Shin; Uiwon Hwang; Sungroh Yoon (ICLR, 2024)

SF(DA)2: Source-free Domain Adaptation Through the Lens of Data Augmentation. - Uiwon Hwang; Jonghyun Lee 004; Juhyeon Shin; Sungroh Yoon (ICLR, 2024)

Gradient Alignment with Prototype Feature for Fully Test-time Adaptation. - Juhyeon Shin; Jonghyun Lee 004; Saehyung Lee; Minjun Park; Dongjun Lee; Uiwon Hwang; Sungroh Yoon (CoRR, 2024)

SF(DA)2: Source-free Domain Adaptation Through the Lens of Data Augmentation. - Uiwon Hwang; Jonghyun Lee 004; Juhyeon Shin; Sungroh Yoon (CoRR, 2024)

RePIC: Reinforced Post-Training for Personalizing Multi-Modal Language Models. - Yeongtak Oh; Jisoo Mok; Dohyun Chung; Juhyeon Shin; Sangha Park; Johan Barthelemy; Sungroh Yoon (CoRR, 2025)