A Low-Cost Jitter Measurement Technique for BIST Applications. - Jui-Jer Huang; Jiun-Lang Huang (Asian Test Symposium, 2003)

An Infrastructure IP for On-Chip Clock Jitter Measurement. - Jui-Jer Huang; Jiun-Lang Huang (ICCD, 2004)

A Low-Cost Jitter Measurement Technique for BIST Applications. - Jiun-Lang Huang; Jui-Jer Huang; Yuan-Shuang Liu (J. Electron. Test., 2006)

Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry. - Jui-Jer Huang; Chiuan-Che Li; Jiun-Lang Huang (ATS, 2008)