Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes. - Yi-Hsin Wu; Jui-Yu Huang; Yi-Chun Yao; Yin-Jing Tien; Cheng-Juei Yu; Sheng-De Wang (IEEE Des. Test, 2021)

SAIM: Scalable Analog Ising Machine for Solving Quadratic Binary Optimization Problems. - Sasan Razmkhah; Jui-Yu Huang; Mehdi Kamal; Massoud Pedram (CoRR, 2024)