Capacitance of semiconductor p-n junction space-charge layers: an overview. - Juin J. Liou; Frederik A. Lindholm (Proc. IEEE, 1988)

An improved latching pulse design for dynamic sense amplifiers. - Jiann S. Yuan; Juin J. Liou (IEEE J. Solid State Circuits, 1990)

Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. - Waisum Wong; Juin J. Liou; Jiann-Shiun Yuan; David M. Wu (VTS, 1991)

Testing the impact of process defects on ECL power-delay performance. - Jiann-Shiun Yuan; Juin J. Liou; David M. Wu (VTS, 1991)

JFET circuit simulation using SPICE implemented with an improved model. - W. W. Wong; Juin J. Liou (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

A Mixed Analog/Digital VLSI Design and Simulation of An Adaptive Resonance Theory (ART) Neural Network Architecture. - Ching S. Ho; Juin J. Liou; Michael Georgiopoulos; Christos G. Christodoulou (Simul., 1996)

Electrostatic discharge in semiconductor devices: an overview. - Jim Vinson; Juin J. Liou (Proc. IEEE, 1998)

An efficient and practical MOS statistical model for digital applications. - Qiang Zhang; Juin J. Liou; John McMacken; Kevin Stiles; J. Ross Thomson; Paul Layman (ISCAS, 2000)

Electrostatic discharge in semiconductor devices: protection techniques. - Jim Vinson; Juin J. Liou (Proc. IEEE, 2000)

SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests. - Qiang Zhang; Juin J. Liou; John McMacken; J. Ross Thomson; Paul Layman (IEEE J. Solid State Circuits, 2001)

Semiconductor devices for RF applications: evolution and current status. - F. Schwierz; Juin J. Liou (Microelectron. Reliab., 2001)

An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique. - Jui-Chu Lee; R. Young; Juin J. Liou; Gregg D. Croft; Joseph C. Bernier (IEEE Trans. Instrum. Meas., 2001)

A Generalized Finite Element Method for Hydrodynamic Modeling of Short-channel Devices. - Min Shen; Ming-C. Cheng; Juin J. Liou (VLSI Design, 2001)

An Upstream Flux Splitting Method for Hydrodynamic Modeling of Deep Submicron Devices. - Min Shen; Wai-Kay Yip; Ming-C. Cheng; Juin J. Liou (VLSI Design, 2001)

Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. - Juin J. Liou; R. Shireen; Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Antonio Cerdeira; Xiaofang Gao; Xuecheng Zou; Ching-Sung Ho (Microelectron. Reliab., 2002)

Statistical modeling of MOS devices for parametric yield prediction. - Juin J. Liou; Qiang Zhang; John McMacken; J. Ross Thomson; Kevin Stiles; Paul Layman (Microelectron. Reliab., 2002)

A review of recent MOSFET threshold voltage extraction methods. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juin J. Liou; Antonio Cerdeira; Magali Estrada; Y. Yue (Microelectron. Reliab., 2002)

Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. - Xiaofang Gao; Juin J. Liou; Joe Bernier; Gregg D. Croft; Adelmo Ortiz-Conde (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Optimization of on-chip ESD protection structures for minimal parasitic capacitance. - Xiaofang Gao; Juin J. Liou; Joe Bernier; Gregg D. Croft; Waisum Wong; Satya Vishwanathan (Microelectron. Reliab., 2003)

Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. - Javier A. Salcedo; Juin J. Liou; Muhammad Yaqub Afridi; Allen R. Hefner (ISCAS (1), 2005)

An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. - Ching-Sung Ho; Kuo-Yin Huang; Ming Tang; Juin J. Liou (Microelectron. Reliab., 2005)

On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC). - Javier A. Salcedo; Juin J. Liou; Muhammad Yaqub Afridi; Allen R. Hefner (Microelectron. Reliab., 2006)

Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation. - Y. Fu; Hei Wong; Juin J. Liou (Microelectron. Reliab., 2007)

Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. - You-Lin Wu; Shi-Tin Lin; Tsung-Min Chang; Juin J. Liou (Microelectron. Reliab., 2007)

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. - Xiaoyang Du; Shurong Dong; Yan Han; Juin J. Liou; Mingxu Huo; You Li; Qiang Cui; Dahai Huang; Demiao Wang (Microelectron. Reliab., 2008)

Investigation of diode geometry and metal line pattern for robust ESD protection applications. - You Li; Juin J. Liou; Jim Vinson (Microelectron. Reliab., 2008)

InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability. - Xiang Liu; Jiann-Shiun Yuan; Juin J. Liou (Microelectron. Reliab., 2008)

Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juan Muci; Denise C. Lugo Muñoz; Álvaro D. Latorre Rey; Ching-Sung Ho; Juin J. Liou (Microelectron. Reliab., 2009)

Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors. - Hei Wong; Y. Fu; Juin J. Liou; Y. Yue (Microelectron. Reliab., 2009)

Editorial. - Juin J. Liou; Chao-Sung Lai (Microelectron. Reliab., 2010)

Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance. - Xiang Liu; Jiann-Shiun Yuan; Juin J. Liou (Microelectron. Reliab., 2010)

Integration-based approach to evaluate the sub-threshold slope of MOSFETs. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juin J. Liou; Ching-Sung Ho (Microelectron. Reliab., 2010)

Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology. - Juin J. Liou; Chang Jiang; Cao Guang-Biao; Chang Gung; Feng Chia (ASICON, 2011)

Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes. - Blerina Aliaj; Vladislav A. Vashchenko; Andrei Shibkov; Juin J. Liou (Microelectron. Reliab., 2011)

A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology. - Hsien-Chin Chiu; Chia-Shih Cheng; Hsuan-Ling Kao; Jeffrey S. Fu; Qiang Cui; Juin J. Liou (Microelectron. Reliab., 2011)

Thermal reliability of VCO using InGaP/GaAs HBTs. - Xiang Liu; Jiann-Shiun Yuan; Juin J. Liou (Microelectron. Reliab., 2011)

Electrostatic discharge (ESD) protection of RF integrated circuits. - Juin J. Liou; Chang Jiang; Feng Chia (APCCAS, 2012)

Integrated amorphous-Si TFT circuits for gate drivers on LCD panels. - Nan-Xiong Huang; Hsi Rong Han; Wen Tui Liao; Chih-Hung Huang; Wen Chun Wang; Miin-Shyue Shiau; Ching-Hwa Cheng; Hong-Chong Wu; Heng-Shou Hsu; Juin J. Liou; Shry-Sann Liao; Ruei-Cheng Sun; et al. (ASICON, 2013)

Challenges on designing electrostatic discharge protection solutions for low power electronics. - Juin J. Liou (ISLPED, 2013)

Novel ESD protection solution for single-ended mixer in GaAs pHEMT technology. - Qiang Cui; Shuyun Zhang; Juin J. Liou (Microelectron. Reliab., 2013)

Revisiting MOSFET threshold voltage extraction methods. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juan Muci; Alberto Terán Barrios; Juin J. Liou; Ching-Sung Ho (Microelectron. Reliab., 2013)

vfTLP-VTH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test. - Yuanzhong Paul Zhou; David Ellis; Jean-Jacques Hajjar; Andrew Olney; Juin J. Liou (Microelectron. Reliab., 2013)

Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications. - Qiang Cui; Srivatsan Parthasarathy; Javier A. Salcedo; Juin J. Liou; Jean-Jacques Hajjar; Yuanzhong Paul Zhou (Microelectron. Reliab., 2014)

A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. - Francisco J. García-Sánchez; Adelmo Ortiz-Conde; Juan Muci; Andrea Sucre-González; Juin J. Liou (Microelectron. Reliab., 2015)

Total ionizing dose sensitivity of function blocks in FRAM. - Ke Gu; Juin J. Liou; Wei Li; Yang Liu 062; Ping Li 014 (Microelectron. Reliab., 2015)

Editorial. - Juin J. Liou; Chun-Chieh Lin; Chu-Hsuan Lin (Microelectron. Reliab., 2015)

Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. - Meng Miao; Yuanzhong Paul Zhou; Javier A. Salcedo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2015)

Design and characterization of ESD solutions with EMC robustness for automotive applications. - Yunfeng Xi; Javier A. Salcedo; Yuanzhong Paul Zhou; Juin J. Liou; Jean-Jacques Hajjar (Microelectron. Reliab., 2015)

Characteristics of ESD protection devices operated under elevated temperatures. - Wei Liang 004; Aihua Dong; Hang Li; Meng Miao; Chung-Chen Kuo; Maxim Klebanov; Juin J. Liou (Microelectron. Reliab., 2016)

Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing. - Weihuai Wang; Hao Jin; Wei Guo; Shurong Dong; Wei Liang 004; Juin J. Liou; Yan Han (Microelectron. Reliab., 2016)

Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions. - Juin J. Liou (ASICON, 2017)

ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. - Aihua Dong; Javier A. Salcedo; Srivatsan Parthasarathy; Yuanzhong Paul Zhou; Sirui Luo; Jean-Jacques Hajjar; Juin J. Liou (Microelectron. Reliab., 2017)

A novel vertical SCR for ESD protection in 40 V HV bipolar process. - Fan Liu; Zhiwei Liu; Jizhi Liu; Cheng Hui; Zhao Liu; Tian Rui; Shiyu Song; Juin J. Liou (Microelectron. Reliab., 2017)

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. - Adelmo Ortiz-Conde; Andrea Sucre-González; Fabián Zárate-Rincón; Reydezel Torres-Torres; Roberto S. Murphy-Arteaga; Juin J. Liou; Francisco J. García-Sánchez (Microelectron. Reliab., 2017)

Application of multiscale Poincaré short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects. - Bagus Haryadi; Juin J. Liou; Hai-Cheng Wei; Ming-Xia Xiao; Hsien-Tsai Wu; Cheuk-Kwan Sun (Comput. Methods Programs Biomed., 2018)

Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. - Zhaonian Yang; Yuan Yang 006; Ningmei Yu; Juin J. Liou (Microelectron. J., 2018)

A double snapback SCR ESD protection scheme for 28 nm CMOS process. - Tao Hu; Shurong Dong; Hao Jin; Hei Wong; Zekun Xu; Xiang Li; Juin J. Liou (Microelectron. Reliab., 2018)

Editorial: IEDMS 2016. - Chuan-Hsi Liu; Chun-Hu Cheng; Chin-Pao Cheng; Juin J. Liou (Microelectron. Reliab., 2018)

Digital Volume Pulse Measured at the Fingertip as an Indicator of Diabetic Peripheral Neuropathy in the Aged and Diabetic. - Hai-Cheng Wei; Na Ta 002; Wen-Rui Hu; Ming-Xia Xiao; Xiao-Jing Tang; Bagus Haryadi; Juin J. Liou; Hsien-Tsai Wu (Entropy, 2019)