SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. - Jing Jie Tan; Rupert Schreiner; Matthias Hausladen; Ali Asgharzade; Simon Edler; Julian Bartsch; Michael Bachmann; Andreas Schels; Ban-Hoe Kwan; Danny Wee-Kiat Ng; Yan Chai Hum (CoRR, 2026)